Atomic force microscopy. Researcher using a computer to analyse images of a sample scanned by an atomic force microscope (AFM,right). Also called scanning force microscopy (SFM),an AFM uses an atomic-sized tip to probe the surface of a material. This allows a three-dimensional map of the surface to be constructed,down to the scale of individual atoms. The first AFM was invented in 1986. Photographed at Tokyo Women's University,Japan | |
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Credit: | Science Photo Library / Crump, Andy |
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