Atomic force microscopy. Researcher examining the surface of a CD-ROM (on screen at right) using atomic force microscopy. This technique places a probe very close to the surface of the object that is being scanned. Atomic forces between the probe and the surface deflect the probe as it is moved over the surface. The probe used is very small and can 'feel' objects as small as 10 picometres,the size of atoms. CD-ROMs are a type of compact disc (CD),a method of storing data as pits on discs of metal and plastic. The data is read by a laser | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Sorrentino, Pasquale |
Bildgröße: | 5164 px × 3400 px |
Modell-Rechte: | Derzeit liegt noch kein Release vor. Bitte kontaktieren Sie uns vor Verwendung. |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: |
|