Silicon carbide tip,transmission electron micrograph (TEM). This ultrasharp silicon carbide tip is thousands of times more wear-resistant at the nanoscale than previous designs. It is 100,000 times smaller than the tip of a pencil and is intended for nanomanufacturing applications such as bio sensors for healthcare and the environment. It was developed by scientists at the University of Pennsylvania,USA,the University of Wisconsin-Madison,USA,and at IBM Research-Zurich,Switzerland. Image published in December 2011. Magnification: x800,000 when printed at 10 centimetres across | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / IBM Research |
Bildgröße: | 3500 px × 3669 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: | - |