Multilayer Laue lenses (MLL),coloured scanning electron micrograph (SEM). These lenses were carved through a process called reactive ion etching. They are designed to focus high-intensity X-rays to within a single nanometre using instruments like the National Synchrotron Light Source II at Brookhaven National Laboratory,New York,USA. Image published in 2012 | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Brookhaven National Laboratory |
Bildgröße: | 3668 px × 2386 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: |
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