Ultrasharp silicon carbide tip. Close-up of the tip of a wear-resistant and ultrasharp silicon carbide probe. The tip is 100,000 times smaller than the tip of a pencil. It was formed by exposing nanoscale silicon tips to carbon ions,and then annealing them. A strong silicon carbide layer formed,but the nanoscale sharpness of the original silicon tip was maintained. This tip is a microcantilever for use in atomic force microscopy. It has been heated to 800 degrees Celsius,making it glow. This research,carried out at the University of Pennsylvania,the University of Wisconsin-Madison and at IBM Research Zurich,was published in 2012 | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / IBM Research |
Bildgröße: | 3421 px × 2567 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: | - |