FE scanning electron microscopy. Researcher operating a field-emission scanning electron microscope (FE-SEM). This is a F JEOL 6320F FE-SEM,equipped with a cold field-emission source and in-lens detectors. It is designed to obtain ultra-high resolution analysis of samples at low accelerating voltage. Compositional mapping techniques that can be used include energy dispersive spectroscopy (EDS) and electron back-scattered diffraction (EBSD). Photographed at the Solar Energy Research Facility (SERF),the National Renewable Energy Laboratory (NREL),Golden,Colorado,USA | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / US DEPARTMENT OF ENERGY / MIKE LINENBERGER, NREL |
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