Scanning electron microscopy. Researcher using a scanning electron microscope (SEM) to characterize samples of various materials. It is used to detect and identify impurities,densities and distributions,concentrations,sub-band gap defects,topography,and crystallographic properties and orientations. Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL),Golden,Colorado,USA | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Yost, Jim / US Department of Energy / NREL |
Bildgröße: | 3200 px × 3200 px |
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