SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples. This device is used to study solid-state surfaces and interfaces,including analyses of polymers,biological specimens,metals,and other materials. This Cameca IMS 5f dynamic SIMS is used to determine the depth distribution of elements in a material. It can identify materials from the lightest of elements up to those of 250 atomic mass units (amu). Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL),Golden,Colorado,USA | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Yost, Jim / US Department of Energy / NREL |
Bildgröße: | 3200 px × 3200 px |
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