MODEL RELEASED. X-ray materials analysis equipment. Researcher controlling an X-ray photoelectron spectrometer (XPS). This is a Kratos Axis Ultra XPS instrument. It is used to analyse the surface chemistry of a material. It measures the composition,chemical state and electronic state of elements found within the material. Photographed at the National Physical Laboratory,Teddington,UK | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Brookes, Andrew / National Physical Laboratory |
Bildgröße: | 4850 px × 3638 px |
Modell-Rechte: | vorhanden |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: | - |