Scanning transmission electron microscopy. Researcher using a scanning transmission electron microscope (STEM) to analyse the structure of solid-state materials. Phenomena studied include grain boundaries,and grain and crystallographic orientation. STEMs are also used for elemental analysis. Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL),Golden,Colorado,USA | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Yost, Jim / US Department of Energy / NREL |
Bildgröße: | 3200 px × 3200 px |
Modell-Rechte: | Derzeit liegt noch kein Release vor. Bitte kontaktieren Sie uns vor Verwendung. |
Restrictions: |
|