Researchers using ellipsometry to measure thin-films in photovoltaic cell research. Ellipsometry is an optical technique for investigating the properties of thin films. Thin-film technology allows photovoltaic cells to be flexible and light,semi-transparent,and capable of lamination onto windows,as well as many other applications. Photographed at the Laboratory of Physics of Interfaces and Thin Films,Ecole Polytechnique,Paris,France | |
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