MODEL RELEASED. Scanning electron microscopy. Female researcher using a scanning electron microscope (SEM) for surface analysis in materials research. An SEM uses beams of electrons in a vacuum,which are scanned over the surface of the sample. A detector picks up any secondary electrons emitted by the sample and the signal is displayed on the monitors at upper left | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Maximilian Stock |
Bildgröße: | 5088 px × 3451 px |
Modell-Rechte: | vorhanden |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: |
|