TOF SIMS spectrometer. Time-of-flight (TOF) secondary ion mass spectrometer (SIMS),used to analyse the surfaces of samples of various materials. This device detects the presence of elements and molecules whose masses range from 1 to over 10,000 atomic mass units (amu). Photographed at the Solar Energy Research Facility (SERF) at the National Renewable Energy Laboratory (NREL),Golden,Colorado,USA | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Yost, Jim / US Department of Energy / NREL |
Bildgröße: | 3200 px × 3200 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: |
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