Focused ion beam nanotechnology research

Videonummer 12543405
Focused ion beam nanotechnology research. Scanning electron micrograph (SEM) footage of a focused ion beam (FIB) facility being used to etch at the nanometre scale. The resulting etching names the Queen's Anniversary Prize for Higher and Further Education for 2017, awarded to the University of Southampton's Optoelectronics Research Centre (ORC, logo included in etching). This FIB device is used for rapid nanostructuring of metallic, semiconducting and dielectric materials and devices. The resolution achieved is as small as 30 nanometres. Additional uses include high-resolution electron microscopy and electron beam lithography, beam-induced deposition of platinum, tungsten, carbon and silicon dioxide, and chemically accelerated milling of insulators. The helium ion microscope provides FIB milling down to scales below 10 nanometres. This research is being carried out in the Zepler Institute by the Nanophotonics and Metamaterials Group of the Optoelectronics Research Centre (ORC) at the University of Southampton, UK. Filmed in 2018.
Lizenzart: Lizenzpflichtig
Credit: Science Photo Library / Bell, Brian
Modell-Rechte: nicht erforderlich
Länge: 19 Sekunden
Seitenverhältnis: 16:9
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