Atomic force microscope (AFM). AFMs are used to study the surfaces of objects at an atomic level. An extremely fine spring-mounted probe,that is either held in contact with the surface or just above it,slowly moves across the surface. Any deflections are recorded and converted into a computer map of the surface. This microscope is a metrological AFM (MAFM),used to calibrate other AFMs. Laser interferometers are used to measure the position of the tip relative to the sample surface. Photographed at the National Physical Laboratory,Teddington,UK | |
Lizenzart: | Lizenzpflichtig |
Credit: | Science Photo Library / Brookes, Andrew / National Physical Laboratory |
Bildgröße: | 4850 px × 3638 px |
Modell-Rechte: | nicht erforderlich |
Eigentums-Rechte: | nicht erforderlich |
Restrictions: | - |